Fred Stevie Secondary Ion Mass Spectrometry (Paperback)Another great item from Rarewaves USA | Free delivery!
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Fred Stevie Secondary Ion Mass Spectrometry (Paperback). Author: Fred Stevie. It also will serve as a reference for those who need to provide SIMS data. Series: Materials Characterization and Analysis Collection. Format: Paperback. Item Length: 152mm. Missing Information?. Further DetailsTitle: Secondary Ion Mass Spectrometry Condition: New Description: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique. Author: Fred Stevie EAN: 9781606505885 Format: Paperback Country/Region of Manufacture: US ISBN: 9781606505885 Publisher: Momentum Press Release Date: 09/15/2015 Item Height: 229mm Item Length: 152mm Genre: Technology & Engineering Language: English Subtitle: Applications for Depth Profiling and Surface Characterization Series: Materials Characterization and Analysis Collection Release Year: 2015 Missing Information?Please contact us if any details are missing and where possible we will add the information to our listing.
